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2502 - Picoamperímetro

Fabricante: Keithley
Código do produto:2502
Picoamperímetro duplo canal, resolução de 1fA

Descrição

Keithley 2502

The Model 2502 Dual-Channel Picoammeter provides two independent picoammeter-voltage source channels for a wide range of low level measurement applications including laser diode testing. The Model 2502 is also designed to increase the throughput of Keithley´s LIV (lightcurrent- voltage) test system for production testing of laser diode modules (LDMs). Developed in close cooperation with leading manufacturers of LDMs for fiberoptic telecommunication networks, this dual-channel instrument has features that make it easy to synchronize with other system elements for tight control over optical power measurements. The Model 2502 features a high speed analog output that allows using the LIV test system at the fiber alignment stage of the LDM manufacturing process. Through the use of buffer memory and a Trigger Link interface that´s unique to Keithley instruments, the Model 2502 can offer the fastest throughput available today for LIV testing of laser diode modules. These instruments are ruggedly engineered to meet the reliability and repeatability demands of continuous operation in round-the-clock production environments.
Dual-channel instrument for optical power measurements, beam measurements, and nanoscale materials and device research
±100V source for bias requirements
Measure photodetector current from 1fA to 20mA
1fA current measurement resolution
Measure optical power directly when used with Model 2500INT IntegratingSphere
0-10V analog output for high resolution optical power feedback
Provides a high accuracy, high speed fiber alignment solution
Supports assembly process, final testing, parts binning, and specification
Allows faster alignment of the fiber with the laser diode-s optimum light emitting region
Combines fiber alignment and device characterization processes
User-programmable photodetector calibration coefficients
3000-point buffer memory on each channel allows data transfer after
test completion
Digital I/O and Trigger Link for binning and sweep test operations
IEEE-488 and RS-232 interfaces

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